“Speed is the new currency of business,” said Marc Benioff, CEO of Salesforce. In my experience, however, speed without quality is nothing but a fast track to failure. This delicate balance between ...

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

Test automation and DevOps play a major role in today's quality assurance landscape. As we know, software development is evolving at a rapid pace. This requires finding robust ways to invest in ...

In the world of products liability, design defect claims arise when the product is inherently dangerous in its design. The test for whether a product is inherently dangerous has evolved in modern ...

A modified Ln-Sec equation should replace the original Ln-Sec equation for all grades of pipe through X80 with full-size Charpy energies of 15 ft-lb and higher. This first part of two articles reviews ...