FA engineers are expected to produce accurate results. Thus, there is no room for error when it comes to the data provided by instruments. Due to its data precision ...
In recent decades, there has been an increased desire to miniaturize electronics, which, in turn, has enhanced the demand for nano-electrical characterization methods. It is crucial that an ...
Electrostatic Force Microscopy (EFM) and dielectric characterisation have emerged as pivotal techniques in the exploration of nanoscale phenomena, enabling researchers to probe the electrical ...
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